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第39号(2020) >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10087/13324

Title: X線回折法を用いたセラミックス材料の評価
Other Titles: Evaluation of Ceramic Materials Using X-ray Diffraction Method
Authors: 平, 靖之
Issue Date: 30-Mar-2021
Citation: 群馬高専レビュー,(39),71-76
Abstract: X-ray diffraction method is very powerful as a method for evaluating ceramic materials. This is a particularly effective methodfor analyzing the crystal structure of crystalline substances. Most of the purposes can be achieved by using the software attached to the measuring device. Even beginners who are not familiar with the evaluation of materials by the X-ray diffraction method can easily analyze the measurement data by referring to the database. These software can be used with confidence even by beginners, and it seems that they are widely used in the actual field of ceramic material research and development, including experts. Software and measuring equipment that even beginners can use with peace of mind are convenient, but they also becomeblack boxes, making it possible to evaluate materials without understanding the contents. This is sufficient for routine work, but when conducting a more detailed study, it is necessary to understand the information that the diffraction peak means. Therefore, the author set up an experiment on the theme of "evaluation of ceramic materials using X-ray diffraction method" in advanced engineering course, and made students understand the X-ray diffraction method to evaluate ceramic materials.
URI: http://hdl.handle.net/10087/13324
ISSN: 2433-9776
Appears in Collections:第39号(2020)

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