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Please use this identifier to cite or link to this item: http://hdl.handle.net/10087/5133

Title: Fe表面上のSm薄膜におけるSm3dXPSスペクトルの膜厚依存性
Other Titles: Dependence of the Sm 3d XPS spectra on the thickness in Sm thin films on Fe
Authors: 飯島, 千尋
奥沢, 誠
Issue Date: 15-Feb-2010
Publisher: 群馬大学教育学部
Citation: 群馬大学教育学部紀要 自然科学編. 58, 45-56 (2010)
Abstract: Eight kinds of Sm thin-films with different thickness have been prepared by deposited on clean Fesurfaces with accuracy of 0.1 nm(Sm(d nm)/Fe(10.0 nm)(d=0.3,0.5,0.7,1.0,1.5,2.0,5.0,10.0)), and the Sm3d 5/2 3/2 XPS spectra of the films have been,in situ,measured at 16K and room temperature. Two lines derived from the Sm3+ in the bulk and from the Sm2+ at the surface have been observed separately in the Sm 3d 5/2 and Sm 3d3/2 spectra, having a composite structure. A shift in the binding energy position of the Sm3+ 3d5/2 lines is found to depend on the film thickness and the temperature. The shift at room temperature has its maximum at Sm-film thickness of about 1 nm and is nearly the same in the range of~2-10nm. The shift at 16K, on the other hand, decreases almost monotonously as the film thickness increases, and shows the same tendency as the case of room temperature in the range of~2-10nm. This suggests the possibility that some interaction would work between the Sm atom in the thin film and the Fe atom in the substrate, and that some phase transition would exist between 16K and room temperature. Detailed discussion will be presented elsewhere.
URI: http://hdl.handle.net/10087/5133
ISSN: 0017-5668
Appears in Collections:第58巻 (2010)

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