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第60巻 (2012) >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10087/6834

Title: Fe/Tb薄膜におけるFe 2p XPS スペクトルの膜厚及び温度依存性
Other Titles: Dependence of the Fe 2p XPS spectra on the thickness and temperature in Fe/Tb thin films
Authors: 芹澤, 嘉彦
奥沢, 誠
Serizawa, Yoshihiko
Okusawa, Makoto
Issue Date: 14-Feb-2012
Publisher: 群馬大学教育学部
Citation: 群馬大学教育学部紀要 自然科学編 60, 33-40, 2012
Abstract: Seven Fe-films with a thickness different from one another have been prepared by deposited on clean Tb surfaces with accuracy of 0.1 nm(Fe(d nm)/Tb(10.0nm) (d=0.2,0.3,0.5,1.0,2.0,5.0,10.0)),and the Fe 2p􌚾􌛉􌚽 XPS spectra of the films have been, in situ, measured at about 8K and room temperature. A shift in the binding energy position of the Fe 2p􌚾􌛉􌚽line is found to depend on the film thickness and the temperature. The shift at room temperature increases almost monotonously as the film thickness increases in the range of 0.2- 2nm,and is nearly the same in the range of 2-10nm. The shift at about 8K,on the other hand,seems to have a composite structure in the range of 0.2-2nm and is the same in the range of 2-10nm. Taking account of an inelastic mean-free-path of about 1.2nm in the Fe film, this implies that the influence of an interface on the electronic states of the Fe atom as well as the Tb atom in Tb/Fe film and the Sm atom in Sm/Fe extends to about 0.8nm from the interface at most and that some phase transition would exist between about 8K and room temperature. Detailed discussion will be presented elsewhere.
URI: http://hdl.handle.net/10087/6834
ISSN: 0017-5668
Appears in Collections:第60巻 (2012)

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