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第62巻 (2014) >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10087/8363

Title: Sm表面上のFe薄膜におけるFe 2p XPSスペクトルの膜厚依存性
Other Titles: Dependence of the Fe 2p XPS spectra on the thicknes in Fe thin films on Sm
Authors: 越智, 啓太
オチ, ケイタ
Ochi, Keita
奥沢, 誠
オクサワ, マコト
Okusawa, Makoto
Keywords: 薄膜
Issue Date: 10-Feb-2014
Publisher: 群馬大学教育学部
Citation: 群馬大学教育学部紀要. 自然科学編. 2014, 62, p.25-33
Abstract: Eight Fe-films with a thickness different from one another have been prepared by deposited on clean Sm surfaces with accuracy of 0.1 nm (Fe(d nm)/Sm(10.0nm)(d=0.3,0.5,0.7,1.0,1.5,2.0,5.0,10.0)),and the Fe 2p3/2XPS spectra of the films have been,in situ,measured at about 8K and room temperature. A shift in the binding energy position of the Fe 2p3/2lines is found to depend on the film thickness and the temperature. At both temperatures,the shift from a peak position of the Fe 2p3/2line in Fe(10.0nm)/Sm(10.0nm)is hardly found in the range of~1-10 nm,whereas it increases monotonously to the low binding energy side as the film thickness decreases in the range of 0.1-~1nm. The value of the shift at about 8K seems to be larger than that at room temperature slightly in the range of 0.1-~1nm. Comparing with the case of Sm(d nm)/Fe(10.0nm) from Chihiro IIJIMA and Makoto OKUSAWA (2010),this suggests that a change in an electronic state takes place in the vicinity of a Fe-Sm interface,and that a charge density on the Fe side becomes large and that on the Sm side small. Detailed discussion will be presented elsewher.
URI: http://hdl.handle.net/10087/8363
ISSN: 0017-5668
Appears in Collections:第62巻 (2014)

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